Using combined virtual plant - pathogen models to compare the influence of wheat architecture on epidemics of two contrasted foliar fungi

Les publications du Cirad

Auteurs Cirad

Publications récentes

Collectifs Cirad
Partenaires
Pays
Champs stratégiques
Thèmes

Using combined virtual plant - pathogen models to compare the influence of wheat architecture on epidemics of two contrasted foliar fungi

Garin G., Fournier C., Pradal C., Houlès V., Robert C.. 2016. In : 2016 IEEE International Conference on Functional-Structural Plant Growth Modeling, Simulation, Visualization and Applications (FSPMA 2016). Qingdao : IEEE, p. 18-18. IEEE International Conference on Functional-Structural Plant Growth Modeling, Simulation, Visualization and Applications (FSPMA 2016), 2016-11-07/2016-11-11, Qingdao (Chine).

Documents associés

Accéder au PDF via la notice Agritrop

Communication de congrès

Agents Cirad, auteurs de cette publication :

Pradal Christophe — Bios / UMR AGAP