At present, many cottons are contaminated to varying degrees by Seed Coat Fragments (SCF) and insect honeydew. It is essential to obtain more information on the quality of the raw material and a more precise description of the yam quality. This paper deals with two instruments developed by Cirad's Cotton Technology Laboratory for detecting and counting these two contaminants. The relationship of Trashcam (an image analysis method for counting SCF), and H2SD (High Speed Stickiness Detector) with reference methods is discussed.